Datasheet Texas Instruments F28M35H52C1RFPT

ManufacturerTexas Instruments
SeriesF28M35H52C
Part NumberF28M35H52C1RFPT
Datasheet Texas Instruments F28M35H52C1RFPT

Concerto Microcontroller 144-HTQFP -40 to 105

Datasheets

F28M35x Concerto Microcontrollers datasheet
PDF, 2.2 Mb, Revision: I, File published: Jun 8, 2015
Extract from the document

Prices

Status

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityYes

Packaging

Pin144
Package TypeRFP
Industry STD TermHTQFP
JEDEC CodeS-PQFP-G
Package QTY60
CarrierJEDEC TRAY (5+1)
Device MarkingF28M35H52C1RFPT
Width (mm)20
Length (mm)20
Thickness (mm)1
Pitch (mm).5
Max Height (mm)1.2
Mechanical DataDownload

Parametrics

# of ADC Modules2
12-bit A/D20 #Channels
ADC Channels20
ADC Conversion Time172 ns
ADC Resolution12-bit
ADC Sample & HoldDual
CAN2
CPUC28x, Cortex-M3
DMA1 6-Ch DMA, 1 32-ch DMA Ch
EMIFYes
Ethernet1
FPUYes
Flash1024 KB
Frequency150,100 MHz
GPIO64
Generation28x + ARM Cortex M3 Concerto Series
I2C3
IO Supply3.3 V
McBSP1
Operating Temperature Range-40 to 105,-40 to 125 C
PWM24 Ch
Package GroupHTQFP
Package Size: mm2:W x L144HTQFP: 484 mm2: 22 x 22(HTQFP) PKG
RAM136 KB
RISC Frequency75,100 MHz
RatingCatalog
SPI5
Timers3 32-Bit CPU,1 WD
Total On-Chip Memory1160 KB
Total Serial Ports2 CANs,3 I2C,5 SPI,6 SCIs,1 McBSP,1 USB,1 Ethernet
UART6
USB1

Eco Plan

RoHSCompliant

Design Kits & Evaluation Modules

  • Evaluation Modules & Boards: TMDSDC3359
    Data Concentrator Evaluation Module
    Lifecycle Status: Active (Recommended for new designs)
  • Evaluation Modules & Boards: TMDSDOCKH52C1
    H52C1 Concerto Experimenter Kit
    Lifecycle Status: Active (Recommended for new designs)
  • Evaluation Modules & Boards: TMDSSOLARCEXPKIT
    Concerto-based Solar Explorer Development Kit
    Lifecycle Status: Active (Recommended for new designs)
  • Daughter Cards: TMDSCNCDH52C1
    H52C1 Concerto controlCARD
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: C2000-GANG
    C2000 Gang Programmer
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: TMDSEMU100V2U-20T
    XDS100v2 JTAG Debug Probe (20-pin cTI version)
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: TMDSEMU100V2U-14T
    XDS100v2 JTAG Debug Probe (14-pin TI version)
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: TMDSEMU200-U
    XDS200 USB Debug Probe
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: TMDSEMU560V2STM-UE
    XDS560v2 System Trace USB & Ethernet Debug Probe
    Lifecycle Status: Active (Recommended for new designs)
  • JTAG Emulators/ Analyzers: TMDSEMU560V2STM-U
    XDS560v2 System Trace USB Debug Probe
    Lifecycle Status: Active (Recommended for new designs)

Application Notes

  • Calculating Useful Lifetimes of Embedded Processors
    PDF, 521 Kb, File published: Nov 11, 2014
    This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. It is aimed at general engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement.
  • Calculator for CAN Bit Timing Parameters
    PDF, 37 Kb, File published: Mar 22, 2016
    Controller Area Network (CAN) nodes use user-specified timing parameters to sample the asynchronous bitstream and recover the clock. These parameters are typically based on the frequency of the available reference oscillator. There may be several options available for a given frequency, and some of them will allow a looser oscillator tolerance than others. This application report details the creat

Model Line

Series: F28M35H52C (3)

Manufacturer's Classification

  • Semiconductors > Microcontrollers (MCU) > Performance MCUs > Control + Automation > F28M3x
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