Datasheet Texas Instruments SN74LVT182502PM

ManufacturerTexas Instruments
SeriesSN74LVT182502
Part NumberSN74LVT182502PM
Datasheet Texas Instruments SN74LVT182502PM

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85

Datasheets

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers (Rev. F)
PDF, 504 Kb, Revision: F, File published: Jul 1, 1996

Prices

Status

Lifecycle StatusObsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample AvailabilityNo

Packaging

Pin64
Package TypePM
Industry STD TermLQFP
JEDEC CodeS-PQFP-G
Width (mm)10
Length (mm)10
Thickness (mm)1.4
Pitch (mm).5
Max Height (mm)1.6
Mechanical DataDownload

Eco Plan

RoHSNot Compliant
Pb FreeNo

Application Notes

  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, Revision: A, File published: Mar 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, File published: Dec 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.

Model Line

Series: SN74LVT182502 (1)
  • SN74LVT182502PM

Manufacturer's Classification

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic
EMS supplier