Datasheet AD8574 (Analog Devices) - 8

TABLE I. Electrical performance characteristics – Continued. 1/ Test Symbol Conditions Temperature, Device Limits Unit VS = 2.7 V, VCM = 1.35 V, TA type VO = 1.35 V Min Max unless otherwise specified Output characteristics – continued. Short circuit limit ISC +25C 01 10 mA -55C to +125C 10 typical Output current IO +25C 01 10 typical mA -55C to +125C 5 typical Power supply. Power supply rejection PSRR VS = 2.7 V to 5.5 V +25C 01 120 dB ratio -55C to +125C 115 Supply current per ISY VO = 0 V +25C 01 900 A amplifier -55C to +125C 1000 Dynamic performance. Slew rate SR RL = 10 k +25C 01 0.5 typical V/s Overload recovery time +25C 01 0.05 typical ms Gain bandwidth GBP +25C 01 1.0 typical MHz product Noise performance. Voltage noise enp-p 0 Hz to 10 Hz +25C 01 2.0 typical Vpp Voltage noise density en f = 1 kHz +25C 01 94 typical nV / Hz Current noise density in f = 10 Hz +25C 01 2 typical fA / Hz 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization and/or design. 2/ Gain testing is dependent upon test bandwidth.
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CODE IDENT NO. DWG NO.
COLUMBUS, OHIO A 16236 V62/12634
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