Datasheet MMBT3906T (ON Semiconductor) - 3
| Manufacturer | ON Semiconductor |
| Description | PNP Bipolar Transistor |
| Pages / Page | 7 / 3 — MMBT3906TT1. Figure 1. Normalized Thermal Response. Figure 2. Delay and … |
| Revision | 3 |
| File Format / Size | PDF / 97 Kb |
| Document Language | English |
MMBT3906TT1. Figure 1. Normalized Thermal Response. Figure 2. Delay and Rise Time. Figure 3. Storage and Fall Time
Model Line for this Datasheet
Text Version of Document
MMBT3906TT1
1.0 ANCE D = 0.5 0.2 RESIST 0.1 0.1 0.05 THERMAL 0.02 0.01 0.01 TRANSIENT SINGLE PULSE 0.001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 r(t), NORMALIZED t, TIME (s)
Figure 1. Normalized Thermal Response
3 V 3 V < 1 ns +9.1 V 275 275 < 1 ns 10 k 10 k 0 CS < 4 pF* 1N916 CS < 4 pF* +10.6 V 300 ns 10 < t1 < 500 ms t 10.9 V DUTY CYCLE = 2% 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Delay and Rise Time Figure 3. Storage and Fall Time Equivalent Test Circuit Equivalent Test Circuit www.onsemi.com 3
1.0 ANCE D = 0.5 0.2 RESIST 0.1 0.1 0.05 THERMAL 0.02 0.01 0.01 TRANSIENT SINGLE PULSE 0.001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 r(t), NORMALIZED t, TIME (s)
Figure 1. Normalized Thermal Response
3 V 3 V < 1 ns +9.1 V 275 275 < 1 ns 10 k 10 k 0 CS < 4 pF* 1N916 CS < 4 pF* +10.6 V 300 ns 10 < t1 < 500 ms t 10.9 V DUTY CYCLE = 2% 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Delay and Rise Time Figure 3. Storage and Fall Time Equivalent Test Circuit Equivalent Test Circuit www.onsemi.com 3
