Datasheet RH1028M, RH1128M (Analog Devices) - 4
| Manufacturer | Analog Devices |
| Description | Radiation Hardened Ultralow Noise Precision High Speed Op Amps |
| Pages / Page | 6 / 4 — tAble 2: electricAl test requireMents. PDA Test Notes. MIL-STD-883 TEST … |
| File Format / Size | PDF / 282 Kb |
| Document Language | English |
tAble 2: electricAl test requireMents. PDA Test Notes. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. SUBGROUP 1. SUBGROUP 2, 3. UNITS
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Text Version of Document
RH1028M/RH1128M
tAble 2: electricAl test requireMents PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specified as 5% based on failures from group A, subgroup 1, tests Final Electrical Test Requirements (Method 5004) 1*,2,3,4 after cooldown as the final electrical test in accordance with method 5004 of Group A Test Requirements (Method 5005) 1,2,3,4 MIL-STD-883 Class B. The verified failures (including Delta parameters) of group Group B** and D for Class S, and 1,2,3,4 A, subgroup 1, after burn-in divided by the total number of devices submitted Group C and D for Class B for burn-in in that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits *PDA Applies to subgroup 1. See PDA Test Notes. than those given. **Post B5 and B6 25ºC Limits are as follows:
SUBGROUP 1 SUBGROUP 2, 3 UNITS
VOS ±240 ±340 µV IOS ±350 ±400 nA IB ±760 ±960 nA
totAl Dose biAs circuit
10k 15V – 10k + 8V –15V RH1028 BIAS
tYpicAl perForMAnce chArActeristics Noise Voltage Density RH1028 Positive Slew Rate RH1028 Negative Slew Rate
2.5 20 20 TA = 25°C TA = 25°C TA = 25°C VS = ±15V VS = ±15V VS = ±15V V 2.0 18 O = ±10V VO = ±10V A 18 VCL = –1 A 10Hz VCL = –1 /µs) /µs) 1.5 16 16 Hz TE (V TE (V /√ nV 1.0 14 14 +SLEW RA –SLEW RA 0.5 12 12 1kHz 0 10 10 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH1028 G01 RH1028 G02 RH1028 G03 rh10281128fe 4 For more information www.linear.com/RH1028M Document Outline Description Electrical Characteristics
tAble 2: electricAl test requireMents PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specified as 5% based on failures from group A, subgroup 1, tests Final Electrical Test Requirements (Method 5004) 1*,2,3,4 after cooldown as the final electrical test in accordance with method 5004 of Group A Test Requirements (Method 5005) 1,2,3,4 MIL-STD-883 Class B. The verified failures (including Delta parameters) of group Group B** and D for Class S, and 1,2,3,4 A, subgroup 1, after burn-in divided by the total number of devices submitted Group C and D for Class B for burn-in in that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits *PDA Applies to subgroup 1. See PDA Test Notes. than those given. **Post B5 and B6 25ºC Limits are as follows:
SUBGROUP 1 SUBGROUP 2, 3 UNITS
VOS ±240 ±340 µV IOS ±350 ±400 nA IB ±760 ±960 nA
totAl Dose biAs circuit
10k 15V – 10k + 8V –15V RH1028 BIAS
tYpicAl perForMAnce chArActeristics Noise Voltage Density RH1028 Positive Slew Rate RH1028 Negative Slew Rate
2.5 20 20 TA = 25°C TA = 25°C TA = 25°C VS = ±15V VS = ±15V VS = ±15V V 2.0 18 O = ±10V VO = ±10V A 18 VCL = –1 A 10Hz VCL = –1 /µs) /µs) 1.5 16 16 Hz TE (V TE (V /√ nV 1.0 14 14 +SLEW RA –SLEW RA 0.5 12 12 1kHz 0 10 10 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH1028 G01 RH1028 G02 RH1028 G03 rh10281128fe 4 For more information www.linear.com/RH1028M Document Outline Description Electrical Characteristics
