Datasheet AD8001 (Analog Devices) - 6

ManufacturerAnalog Devices
Description800 MHz, 50 mW Current Feedback Amplifier
Pages / Page11 / 6 — STANDARD. 5962-94593. MICROCIRCUIT DRAWING
File Format / SizePDF / 124 Kb
Document LanguageEnglish

STANDARD. 5962-94593. MICROCIRCUIT DRAWING

STANDARD 5962-94593 MICROCIRCUIT DRAWING

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TABLE I. Electrical performance characteristics – Continued. Conditions 1/ 2/ 3/ Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits Unit unless otherwise specified subgroups type Min Max Dynamic performance section Small signal bandwidth SSBW -3 dB, G = +2, R 4 All 350 MHz F = 750 Ω, 4/ 5/ peaking < 0.1 dB, TA = +25°C -3 dB, G = +1, R 650 F = 1 kΩ, peaking < 1 dB, TA = +25°C Bandwidth for 0.1 dB BW G = +2, R 4 All 85 MHz F = 750 Ω, flatness 4/ 5/ TA = +25°C Slew rate 4/ 5/ SR G = +2, V 4 All 800 V/µs OUT = 2 V step, TA = +25°C G = -1, V 960 OUT = 2 V step, TA = +25°C Noise and harmonic performance section Differential gain error 4/ 5/ DGE G = +2, R 4 All 0.025 % L = 150 Ω, TA = +25°C Differential phase error 4/ 5/ DPE G = +2, R 4 All 0.04 Degree L = 150 Ω, TA = +25°C 1/ Device type 01 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device type 02 supplied to this drawing has been characterized at levels L and R of irradiation. However, device type 01 is only tested at the “R” level and device type 02 is only tested at the “L” level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25°C. 2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. For device type 02, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. 3/ Unless otherwise specified, VS = ±5 V and RL = 100 Ω. 4/ Not tested post irradiation. 5/ Parameter is guaranteed by engineering characterization, no production tested. Characterization is repeated after major design or process changes.
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5962-94593 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 E 6 DSCC FORM 2234 APR 97 Document Outline DEPARTMENT OF DEFENSE SPECIFICATION DEPARTMENT OF DEFENSE STANDARDS
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