Datasheet LT1028, LT1128 (Analog Devices) - 5
| Manufacturer | Analog Devices |
| Description | Ultra Low Noise Precision High Speed Op Amps |
| Pages / Page | 28 / 5 — ELECTRICAL CHARACTERISTICS The. denotes the specifications which apply … |
| File Format / Size | PDF / 730 Kb |
| Document Language | English |
ELECTRICAL CHARACTERISTICS The. denotes the specifications which apply over the operating
Model Line for this Datasheet
Text Version of Document
LT1028/LT1128
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the operating temperature range –40°C ≤ TA ≤ 85°C. VS = ±15V, unless otherwise noted. (Note 11) LT1028AC LT1028C LT1128AC LT1128C SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS
VOS Input Offset Voltage l 20 95 35 150 µV ∆VOS Average Input Offset Drift (Note 8) l 0.2 0.8 0.25 1.0 µV/°C ∆Temp IOS Input Offset Current VCM = 0V l 20 80 28 160 nA IB Input Bias Current VCM = 0V l ±35 ±140 ±45 ±280 nA Input Voltage Range l ±10.4 ±11.8 ±10.4 ±11.8 V CMRR Common Mode Rejection Ratio VCM = ±10.5V l 108 123 102 123 dB PSRR Power Supply Rejection Ratio VS = ±4.5V to ±18V l 112 131 106 131 dB AVOL Large-Signal Voltage Gain RL ≥ 2k, VO = ±10V l 4.0 20.0 2.5 20.0 V/µV RL ≥ 1k, VO = ±10V 3.0 14.0 2.0 14.0 V/µV VOUT Maximum Output Voltage Swing RL ≥ 2k l ±11.0 ±12.5 ±11.0 ±12.5 V IS Supply Current l 8.5 11.0 8.7 12.5 mA
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 6:
Current noise is defined and measured with balanced source may cause permanent damage to the device. Exposure to any Absolute resistors. The resultant voltage noise (after subtracting the resistor noise Maximum Rating condition for extended periods may affect device on an RMS basis) is divided by the sum of the two source resistors to reliability and lifetime. obtain current noise. Maximum 10Hz current noise can be inferred from
Note 2:
Input Offset Voltage measurements are performed by automatic 100% testing at 1kHz. test equipment approximately 0.5 sec. after application of power. In
Note 7:
Gain-bandwidth product is not tested. It is guaranteed by design addition, at TA = 25°C, offset voltage is measured with the chip heated and by inference from the slew rate measurement. to approximately 55°C to account for the chip temperature rise when the
Note 8:
This parameter is not 100% tested. device is fully warmed up. Note 9: The inputs are protected by back-to-back diodes. Current-limiting
Note 3:
Long Term Input Offset Voltage Stability refers to the average resistors are not used in order to achieve low noise. If differential input trend line of Offset Voltage vs Time over extended periods after the first 30 voltage exceeds ±1.8V, the input current should be limited to 25mA. days of operation. Excluding the initial hour of operation, changes in VOS
Note 10:
This parameter guaranteed by design, fully warmed up at T during the first 30 days are typically 2.5µV. A = 70°C. It includes chip temperature increase due to supply and load
Note 4:
This parameter is tested on a sample basis only. currents.
Note 5:
10Hz noise voltage density is sample tested on every lot with the
Note 11:
The LT1028/LT1128 are designed, characterized and expected to exception of the S8 and S16 packages. Devices 100% tested at 10Hz are meet these extended temperature limits, but are not tested at –40°C and available on request. 85°C. Guaranteed I-grade parts are available. Consult factory. 1028fd For more information www.linear.com/LT1028 5 Document Outline Features Applications Description Typical Application Absolute Maximum Ratings Pin Configuration Order Information Electrical Characteristics Typical Performance Characteristics Applications Information - Noise Applications Information Typical Applications Schematic Diagram Package Description Revision History Typical Application Related Parts
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the operating temperature range –40°C ≤ TA ≤ 85°C. VS = ±15V, unless otherwise noted. (Note 11) LT1028AC LT1028C LT1128AC LT1128C SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS
VOS Input Offset Voltage l 20 95 35 150 µV ∆VOS Average Input Offset Drift (Note 8) l 0.2 0.8 0.25 1.0 µV/°C ∆Temp IOS Input Offset Current VCM = 0V l 20 80 28 160 nA IB Input Bias Current VCM = 0V l ±35 ±140 ±45 ±280 nA Input Voltage Range l ±10.4 ±11.8 ±10.4 ±11.8 V CMRR Common Mode Rejection Ratio VCM = ±10.5V l 108 123 102 123 dB PSRR Power Supply Rejection Ratio VS = ±4.5V to ±18V l 112 131 106 131 dB AVOL Large-Signal Voltage Gain RL ≥ 2k, VO = ±10V l 4.0 20.0 2.5 20.0 V/µV RL ≥ 1k, VO = ±10V 3.0 14.0 2.0 14.0 V/µV VOUT Maximum Output Voltage Swing RL ≥ 2k l ±11.0 ±12.5 ±11.0 ±12.5 V IS Supply Current l 8.5 11.0 8.7 12.5 mA
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 6:
Current noise is defined and measured with balanced source may cause permanent damage to the device. Exposure to any Absolute resistors. The resultant voltage noise (after subtracting the resistor noise Maximum Rating condition for extended periods may affect device on an RMS basis) is divided by the sum of the two source resistors to reliability and lifetime. obtain current noise. Maximum 10Hz current noise can be inferred from
Note 2:
Input Offset Voltage measurements are performed by automatic 100% testing at 1kHz. test equipment approximately 0.5 sec. after application of power. In
Note 7:
Gain-bandwidth product is not tested. It is guaranteed by design addition, at TA = 25°C, offset voltage is measured with the chip heated and by inference from the slew rate measurement. to approximately 55°C to account for the chip temperature rise when the
Note 8:
This parameter is not 100% tested. device is fully warmed up. Note 9: The inputs are protected by back-to-back diodes. Current-limiting
Note 3:
Long Term Input Offset Voltage Stability refers to the average resistors are not used in order to achieve low noise. If differential input trend line of Offset Voltage vs Time over extended periods after the first 30 voltage exceeds ±1.8V, the input current should be limited to 25mA. days of operation. Excluding the initial hour of operation, changes in VOS
Note 10:
This parameter guaranteed by design, fully warmed up at T during the first 30 days are typically 2.5µV. A = 70°C. It includes chip temperature increase due to supply and load
Note 4:
This parameter is tested on a sample basis only. currents.
Note 5:
10Hz noise voltage density is sample tested on every lot with the
Note 11:
The LT1028/LT1128 are designed, characterized and expected to exception of the S8 and S16 packages. Devices 100% tested at 10Hz are meet these extended temperature limits, but are not tested at –40°C and available on request. 85°C. Guaranteed I-grade parts are available. Consult factory. 1028fd For more information www.linear.com/LT1028 5 Document Outline Features Applications Description Typical Application Absolute Maximum Ratings Pin Configuration Order Information Electrical Characteristics Typical Performance Characteristics Applications Information - Noise Applications Information Typical Applications Schematic Diagram Package Description Revision History Typical Application Related Parts
