Datasheet ADUM1234 (Analog Devices) - 9

ManufacturerAnalog Devices
DescriptionIsolated, Precision Half-Bridge Driver, 0.1 A Output
Pages / Page12 / 9 — Data Sheet. ADuM1234. APPLICATIONS INFORMATION COMMON-MODE TRANSIENT …
RevisionA
File Format / SizePDF / 262 Kb
Document LanguageEnglish

Data Sheet. ADuM1234. APPLICATIONS INFORMATION COMMON-MODE TRANSIENT IMMUNITY. 300. 250. ) s /µ. BEST-CASE PROCESS VARIATION. V k. 200

Data Sheet ADuM1234 APPLICATIONS INFORMATION COMMON-MODE TRANSIENT IMMUNITY 300 250 ) s /µ BEST-CASE PROCESS VARIATION V k 200

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Data Sheet ADuM1234 APPLICATIONS INFORMATION COMMON-MODE TRANSIENT IMMUNITY
Figure 10 and Figure 11 characterize the ability of the ADuM1234 In general, common-mode transients consist of linear and to operate correctly in the presence of sinusoidal transients. The sinusoidal components. The linear component of a common- data is based on design simulation and is the maximum sinusoidal mode transient is given by transient magnitude (2πf V0) that the ADuM1234 can tolerate without an operational error. Values for immunity against sinu- VCM, linear = (ΔV/Δt)t soidal transients are not included in Table 6 because measurements where ΔV/Δt is the slope of the transient shown in Figure 12 to obtain such values have not been possible. and Figure 13.
300
The transient of the linear component is given by
250
dVCM/dt = ΔV/Δt
) s /µ BEST-CASE PROCESS VARIATION
Figure 9 characterizes the ability of the ADuM1234 to operate
V k 200 (
correctly in the presence of linear transients. The data is based on
Y IT N
design simulation and is the maximum linear transient magnitude
U 150
that the ADuM1234 can tolerate without an operational error. This
IMM T N
data shows a higher level of robustness than the values listed in
IE 100 S
Table 6 because the transient immunity values obtained in Table 6
N A R
use measured data and apply allowances for measurement error
T 50
and margin.
WORST-CASE PROCESS VARIATION 400 0
2
0 250 500 750 1000 1250 1500 1750 2000
01 0-
FREQUENCY (MHz)
92
350
06 Figure 10. Transient Immunity (Sinusoidal Transients),
) BEST-CASE PROCESS VARIATION s 300
27°C Ambient Temperature
/µ V k ( Y 250 T 250 NI U M 200 M I NT 150 200 ) IE s WORST-CASE PROCESS VARIATION /µ V 100 k BEST-CASE PROCESS VARIATION RANS ( T Y T 150 50 UNI M M 0
1
I T 100 –40 –20 0 20 40 60 80 100
01 0-
N TEMPERATURE (°C)
92
IE
06
S
Figure 9. Transient Immunity (Linear Transients) vs. Temperature
RAN T 50
The sinusoidal component (at a given frequency) is given by
WORST-CASE PROCESS VARIATION
VCM, sinusoidal = V0sin(2πft)
0
3
0 250 500 750 1000 1250 1500 1750 2000
-01 where:
FREQUENCY (MHz)
920 06 V0 is the magnitude of the sinusoidal. Figure 11. Transient Immunity (Sinusoidal Transients), f is the frequency of the sinusoidal. 100°C Ambient Temperature The transient magnitude of the sinusoidal component is given by dV CM/dt = 2πf V0 Rev. A | Page 9 of 12 Document Outline Features Applications General Description Functional Block Diagram Table of Contents Revision History Specifications Electrical Characteristics Package Characteristics Regulatory Information Insulation and Safety-Related Specifications DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 Insulation Characteristics Recommended Operating Conditions Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Perfomance Characteristics Applications Information Common-Mode Transient Immunity Insulation Lifetime Outline Dimensions Ordering Guide
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