Datasheet LTC5597 (Analog Devices) - 16

ManufacturerAnalog Devices
Description100MHz to 70GHz Linear-in-dB RMS Power Detector with 35dB Dynamic Range
Pages / Page22 / 16 — TEST CIRCUIT. REF DES. VALUE. SIZE. PART NUMBER. Figure 1. Test Schematic …
File Format / SizePDF / 2.3 Mb
Document LanguageEnglish

TEST CIRCUIT. REF DES. VALUE. SIZE. PART NUMBER. Figure 1. Test Schematic Optimized for 100MHz to 70 GHz

TEST CIRCUIT REF DES VALUE SIZE PART NUMBER Figure 1 Test Schematic Optimized for 100MHz to 70 GHz

Model Line for this Datasheet

Text Version of Document

LTC5597
TEST CIRCUIT
R1 R2 470Ω 1Ω EN 3.3V C8 C1 10pF 8 1 100nF EN VCC LTC5597 7 2 GND OUT J3 C3 OUT 6 3 R7 J1 C4 RF NC IN FLTR NC RF INPUT NC 5 4 GND GND EXPOSED PAD 5597 F01 9
REF DES VALUE SIZE PART NUMBER
C1 100nF 0402 MURATA 935152424610-T3N C3, C4 NC 0402 C8 10pF 0402 MURATA GRM155C1H100JA01D R1 470Ω 0402 VISHAY CRCW0402470RFKED R2 1Ω 0402 VISHAY CRCW04021R00FNED R7 NC 0402 J1 1.85mm JACK to EDGE- SOUTHWEST MICROWAVE 1892-03A-6 LAUNCH, DC-67GHz J3 SMA 50Ω EDGE-LAUNCH E.F. JOHNSON, 142-0701-851
Figure 1. Test Schematic Optimized for 100MHz to 70 GHz
5597 F02a 5597 F02b
Figure 2a. Top Side of Evaluation Board Figure 2b. Bottom Side of Evaluation Board
Rev. 0 16 For more information www.analog.com Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Electrical Characteristics Pin Configuration Electrical Characteristics Typical Performance Characteristics Pin Functions Test Circuit Applications Information Package Description Typical Application Related Parts