Datasheet SQJ264EP (Vishay) - 3

ManufacturerVishay
DescriptionAutomotive Dual N-Channel 60 V (D-S) 175 °C MOSFETs
Pages / Page12 / 3 — SQJ264EP. SPECIFICATIONS. PARAMETER SYMBOL. TEST. CONDITIONS. MIN. TYP. …
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SQJ264EP. SPECIFICATIONS. PARAMETER SYMBOL. TEST. CONDITIONS. MIN. TYP. MAX. UNIT. Dynamic b

SQJ264EP SPECIFICATIONS PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Dynamic b

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SQJ264EP
www.vishay.com Vishay Siliconix
SPECIFICATIONS
(TC = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT Dynamic b
VDD = 30 V, RL = 20 Ω, ID ≅ 1.5 A, VGEN = 10 V, Rg = 1 Ω N-Ch 1 - 11 18 Turn-on delay time c td(on) VDD = 30 V, RL = 10 Ω, ID ≅ 3 A, VGEN = 10 V, Rg = 1 Ω N-Ch 2 - 12 25 VDD = 30 V, RL = 20 Ω, ID ≅ 1.5 A, VGEN = 10 V, Rg = 1 Ω N-Ch 1 - 2 5 Rise time c tr VDD = 30 V, RL = 10 Ω, ID ≅ 3 A, VGEN = 10 V, Rg = 1 Ω N-Ch 2 - 3 5 ns VDD = 30 V, RL = 20 Ω, ID ≅ 1.5 A, VGEN = 10 V, Rg = 1 Ω N-Ch 1 - 16 30 Turn-off delay time c td(off) VDD = 30 V, RL = 10 Ω, ID ≅ 3 A, VGEN = 10 V, Rg = 1 Ω N-Ch 2 - 20 40 VDD = 30 V, RL = 20 Ω, ID ≅ 1.5 A, VGEN = 10 V, Rg = 1 Ω N-Ch 1 - 8 15 Fall time c tf VDD = 30 V, RL = 10 Ω, ID ≅ 3 A, VGEN = 10 V, Rg = 1 Ω N-Ch 2 - 11 18
Source-Drain Diode Ratings and Characteristics b
N-Ch 1 - - 65 Pulsed current a ISM A N-Ch 2 - - 90 IF = 6 A, VGS = 0 V N-Ch 1 - 0.82 1.2 Forward voltage VSD V IF = 10 A, VGS = 0 V N-Ch 2 - 0.80 1.2 IF = 4 A, di/dt = 100 A/μs N-Ch 1 - 22 45 Body diode reverse recovery time trr ns IF = 5 A, di/dt = 100 A/μs N-Ch 2 - 41 85 IF = 4 A, di/dt = 100 A/μs N-Ch 1 - 15 30 Body diode reverse recovery charge Qrr nC IF = 5 A, di/dt = 100 A/μs N-Ch 2 - 36 75 IF = 4 A, di/dt = 100 A/μs N-Ch 1 - 12 - Reverse recovery fall time ta IF = 5 A, di/dt = 100 A/μs N-Ch 2 - 19 - ns IF = 4 A, di/dt = 100 A/μs N-Ch 1 - 10 - Reverse recovery rise time tb IF = 5 A, di/dt = 100 A/μs N-Ch 2 - 22 - Body diode peak reverse recovery IF = 4 A, di/dt = 100 A/μs N-Ch 1 - -1.3 - I A current RM(REC) IF = 5 A, di/dt = 100 A/μs N-Ch 2 - -1.6 -
Notes
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 % b. Guaranteed by design, not subject to production testing c. Independent of operating temperature Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. S19-1108-Rev. A, 30-Dec-2019
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