Datasheet LA4160 (Sanyo) - 3

LA4160
Test Circuit Diagram
470μF
4.7μF 220μF + A +
+ VCC 470μF +
8 9 10 11 12 13 14 3 2 1 2.2kΩ 10pF A SW1 1 LA4160 SW3 2
Rg
600Ω 7 6 5 4 + 100μF
22μF 51kΩ
+
10μF
4.7kΩ
SW5 SW2 30kΩ 56Ω 0.033μF 51Ω Pre out SW6
+ SW7
470μF +
100μF D 0.15μF
Polyester
film
capacitor B
SW4 PWR OUT 470μF
+ SG RL
4Ω 20 to 20k Hz C B.P.F
+ 10kΩ SW8 680Ω 4.7μF
3.9kΩ +
47μF 300kΩ 1S188×2 Test Method
Switch SW1 SW2 SW3 SW4 SW5 SW6 SW7 SW8 Test area ICCO − on on off on on off off − VG 2 off off off on on off off A, D PO 2 off off off on on off off D THD 2 off off off on on off off D Test THD at output voltage VO = 1V. VNO − on off off on on off off D Test output noise voltage VNR − on off off on on off off D VGO 1 off off on off on off off A, B VO max 1 off off off on on off off B VNI − off on off on on on off C 1 off off off off off off on A, B preamplifier Power amplifier Item ALC Input
level Test method
Test circuit current.
20log VO/Vi (dB), where input voltage is Vi,
output voltage Vo.
Test output voltage at THD = 10% and convet it
into output. Superpose ripple (100Hz) 150mV on supply
voltage and test output ripple.
20log VO/Vi (dB).
Test output voltage at THD = 1%.
Convert output noise voltage at Rg = 2.2kΩ by
using gain at 1kHz.
Test input voltage at THD = 1%. No.870-3/11