Product brochure RTP High-Performance Oscilloscope (Rohde&Schwarz) - 10
| Manufacturer | Rohde&Schwarz |
| Description | RTP High-Performance Oscilloscope |
| Pages / Page | 34 / 10 — Powerful jitter analysis functions. Jitter measurement functions. … |
| Revision | 01.02 |
| File Format / Size | PDF / 23.7 Mb |
| Document Language | English |
Powerful jitter analysis functions. Jitter measurement functions. Standard functions. R&S®RTP-K12 option. Long-term trend:
Text Version of Document
Comprehensive analysis tools Jitter analysis
Powerful jitter analysis functions Jitter measurement functions
R&S®RTP oscilloscopes offer a wide range of jitter analysis
Standard functions R&S®RTP-K12 option
functions. You can start with automated jitter measure- Period cycle-to-cycle jitter ments like cycle-to-cycle jitter and time interval error (TIE). Frequency N-cycle jitter And then see further signal details with additional tools Setup cycle-to-cycle width Setup/hold time cycle-cycle duty cycle such as track, long-term trend and FFT on track. As an Setup/hold ratio time interval error example, you can determine frequency interference by data rate applying FFT analysis to the cycle-to-cycle jitter measure- unit interval skew delay ment track. skew phase The following displays and analysis functions are available: ❙
Long-term trend:
display of measurement results from different acquisitions in a separate figure to detect slowly developing trends, such as thermal changes ❙
Track:
graphic display of multiple measurement results (i.e. TIE) over the entire acquisition period ❙
Histogram:
convolution density of measurement results in a bar graph ❙
FFT on track:
FFT analysis on the measurement result’s track curve ❙
Eye diagram:
automated eye diagram measurements and mask tests for data signals with separate clock signals, e.g. DDR interfaces (available as an option) Detection of frequency interference within a clock signal: tracking of TIE jitter; histogram and FFT analysis of track curve. Eye diagram measurements of a DDR memory data signal.
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RTP_bro_en_5215-4152_12_v0102.indd 10 07.06.2018 13:43:17
Powerful jitter analysis functions Jitter measurement functions
R&S®RTP oscilloscopes offer a wide range of jitter analysis
Standard functions R&S®RTP-K12 option
functions. You can start with automated jitter measure- Period cycle-to-cycle jitter ments like cycle-to-cycle jitter and time interval error (TIE). Frequency N-cycle jitter And then see further signal details with additional tools Setup cycle-to-cycle width Setup/hold time cycle-cycle duty cycle such as track, long-term trend and FFT on track. As an Setup/hold ratio time interval error example, you can determine frequency interference by data rate applying FFT analysis to the cycle-to-cycle jitter measure- unit interval skew delay ment track. skew phase The following displays and analysis functions are available: ❙
Long-term trend:
display of measurement results from different acquisitions in a separate figure to detect slowly developing trends, such as thermal changes ❙
Track:
graphic display of multiple measurement results (i.e. TIE) over the entire acquisition period ❙
Histogram:
convolution density of measurement results in a bar graph ❙
FFT on track:
FFT analysis on the measurement result’s track curve ❙
Eye diagram:
automated eye diagram measurements and mask tests for data signals with separate clock signals, e.g. DDR interfaces (available as an option) Detection of frequency interference within a clock signal: tracking of TIE jitter; histogram and FFT analysis of track curve. Eye diagram measurements of a DDR memory data signal.
10
RTP_bro_en_5215-4152_12_v0102.indd 10 07.06.2018 13:43:17
