Datasheet Texas Instruments ADS4226IRGCT
Manufacturer | Texas Instruments |
Series | ADS4226 |
Part Number | ADS4226IRGCT |
Dual-Channel, 12-Bit, 160-MSPS Analog-to-Digital Converter (ADC) 64-VQFN -40 to 85
Datasheets
ADS42xx Dual-Channel, 14-/12-Bit, 160/125/65 MSPS Ultralow-Power ADC datasheet
PDF, 4.2 Mb, Revision: D, File published: Oct 27, 2015
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Status
Lifecycle Status | Active (Recommended for new designs) |
Manufacture's Sample Availability | Yes |
Packaging
Pin | 64 |
Package Type | RGC |
Industry STD Term | VQFN |
JEDEC Code | S-PQFP-N |
Package QTY | 250 |
Carrier | SMALL T&R |
Device Marking | AZ4226 |
Width (mm) | 9 |
Length (mm) | 9 |
Thickness (mm) | .88 |
Pitch (mm) | .5 |
Max Height (mm) | 1 |
Mechanical Data | Download |
Parametrics
# Input Channels | 2 |
Analog Input BW | 600 MHz |
Architecture | Pipeline |
DNL(Max) | 1.7 +/-LSB |
DNL(Typ) | 0.5 +/-LSB |
ENOB | 11.4 Bits |
INL(Max) | 5 +/-LSB |
INL(Typ) | 2 +/-LSB |
Input Buffer | No |
Input Range | 2 Vp-p |
Interface | DDR LVDS,Parallel CMOS |
Operating Temperature Range | -40 to 85 C |
Package Group | VQFN |
Package Size: mm2:W x L | 64VQFN: 81 mm2: 9 x 9(VQFN) PKG |
Power Consumption(Typ) | 332 mW |
Rating | Catalog |
Reference Mode | Int |
Resolution | 12 Bits |
SFDR | 87 dB |
SINAD | 70.4 dB |
SNR | 70.5 dB |
Sample Rate(Max) | 160 MSPS |
Eco Plan
RoHS | Compliant |
Design Kits & Evaluation Modules
- Evaluation Modules & Boards: ADS4226EVM
ADS4226 Dual-Channel, 12-Bit, 160-MSPS Analog-to-Digital Converter Evaluation Module
Lifecycle Status: Active (Recommended for new designs) - Evaluation Modules & Boards: TSW2200EVM
TSW2200 Low-Cost Portable Power Supply Evaluation Module
Lifecycle Status: Active (Recommended for new designs) - Evaluation Modules & Boards: TSW1405EVM
Data Capture: Data Converter EVMs With 8 LVDS Lanes up to 1.0Gbps
Lifecycle Status: Active (Recommended for new designs)
Application Notes
- High-Speed Analog-to-Digital Converter BasicsPDF, 1.1 Mb, File published: Jan 11, 2012
The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed analog-to-digital converters (ADC). This document provides details on sampling theorydata-sheet specifications ADC selection criteria and evaluation methods clock jitter and other commonsystem-level concerns. In addition some end-users will want to extend the performance capabil - QFN Layout GuidelinesPDF, 1.3 Mb, File published: Jul 28, 2006
Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs. - CDCE62005 as Clock Solution for High-Speed ADCsPDF, 805 Kb, File published: Sep 4, 2008
TI has introduced a family of devices well-suited to meet the demands for high-speed ADC devices such as the ADS5527 which is capable of sampling up to 210 MSPS. To realize the full potential of these high-performance products it is imperative to provide a low phase noise clock source. The CDCE62005 clock synthesizer chip offers a real-world clocking solution to meet these stringent requirements - Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)PDF, 1.2 Mb, Revision: A, File published: Jul 19, 2013
- Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)PDF, 2.0 Mb, Revision: A, File published: May 22, 2015
- Phase Noise Performance and Jitter Cleaning Ability of CDCE72010PDF, 2.3 Mb, File published: Jun 2, 2008
This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig - CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital ConvertersPDF, 424 Kb, File published: Jun 8, 2008
Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers - Principles of Data Acquisition and Conversion (Rev. A)PDF, 132 Kb, Revision: A, File published: Apr 16, 2015
- A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)PDF, 425 Kb, Revision: B, File published: Oct 9, 2011
This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference. - Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)PDF, 69 Kb, Revision: A, File published: May 18, 2015
Model Line
Series: ADS4226 (2)
- ADS4226IRGCR ADS4226IRGCT
Manufacturer's Classification
- Semiconductors > Data Converters > Analog-to-Digital Converters (ADCs) > High Speed ADCs (>10MSPS)