Datasheet LTM4651 (Analog Devices) - 5

ManufacturerAnalog Devices
DescriptionEN55022B Compliant 58V, 24W Inverting-Output DC/DC μModule Regulator
Pages / Page36 / 5 — ELECTRICAL CHARACTERISTICS The. denotes the specifications which apply …
RevisionA
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ELECTRICAL CHARACTERISTICS The. denotes the specifications which apply over the specified internal

ELECTRICAL CHARACTERISTICS The denotes the specifications which apply over the specified internal

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LTM4651
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the specified internal operating temperature range (Note 2). T A = 25
°
C, Test Circuit 1, VIN = 24V and electrically connected to SVIN and RUN, ISETa – SVOUT = 24V, EXTVCC = PGND, CLKIN open circuit, RfSET = 57.6kΩ and RISET = 480kΩ and voltages referred to PGND unless otherwise noted. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS Input Voltage Regulation Pin
VVINREG VINREG Servo Voltage VINREG Voltage During Output Current Regulation, l 1.8 2.0 2.2 V Measured with Respect to SV – OUT I – VINREG VINREG Leakage Current VINREG – SVOUT = 2V 1 nA
INTV
CC
Regulator
V – INTVCC Channel Internal VCC Voltage, No 3.6V ≤ SVIN – SVOUT ≤ 58V, EXTVCC = Open Circuit 3.15 3.4 3.65 V INTV – – CC Loading (IINTVCC = 0mA) 5V ≤ SVIN – SVOUT ≤ 58V, 3.2V ≤ EXTVCC – VOUT ≤ 26.5V 2.85 3.0 3.15 V (INTV – CC Measured with Respect to VOUT ) V VEXTVCC(TH) EXTVCC Switchover Voltage (Note 4) 3.15 V ∆VINTVCC(LOAD)/ INTVCC Load Regulation 0mA ≤ IINTVCC ≤ 30mA –2 0.5 2 % VINTVCC
Temperature Sensor
∆V + – TEMP Temperature Sensor Forward Voltage, ITEMP = 100µA and ITEMP = –100μA at TA = 25°C 0.6 V V + – TEMP – VTEMP TC∆V(TEMP) ∆VTEMP Temperature Coefficient –2.0 mV/°C
Note 1:
Stresses beyond those listing under Absolute Maximum Ratings
Note 5:
V – OUT(–0.5VDC) low line regulation is tested at 3.6VIN, with fSET and may cause permanent damage to the device. Exposure to any Absolute CLKIN open circuit. High line regulation is tested at 28VIN, and with CLKIN Maximum Rating conditions for extended periods may affect device driven at 200kHz—so as to ensure minimum on time criteria is met. The reliability and lifetime. LTM4651 is not recommended for applications where the minimum on-
Note 2:
The LTM4651 is tested under pulsed load conditions such that time criteria (guardband to 90ns) is continuously violated. The LTM4651 T can ride through events (such as V J ≈ TA. The LTM4651E is guaranteed to meet performance specifications IN surge) where the on-time criteria is over the 0°C to 125°C internal operating temperature range. Specifications transiently violated. See the Applications Information section. over the full –40°C to 125°C internal operating temperature range are
Note 6:
V – OUT(–24VDC) is tested at 3.6VIN and 34VIN, with CLKIN driven assured by design, characterization and correlation with statistical process with a 1.8MHz clock, ISETa – SV – OUT = 24V, and RfSET = 57.6kΩ. It is also controls. The LTM4651I is guaranteed to meet specifications over the full tested at 24VIN, with CLKIN driven with a 1.5MHz clock, RfSET = 57.6kΩ, internal operating temperature range. Note that the maximum ambient and RISET = 480kΩ. temperature consistent with these specifications is determined by specific
Note 7:
This IC includes overtemperature protection that is intended operating conditions in conjunction with board layout, the rated package to protect the device during momentary overload conditions. Junction thermal resistance and other environmental factors. temperature will exceed 125°C when overtemperature protection is active.
Note 3:
See output current derating curves for different VIN, VOUT, and TA, Continuous operation above the specified maximum operating junction located in the Applications Information section. temperature may impair device reliability.
Note 4:
Minimum on-time, VIN Overvoltage Lockout and Overvoltage
Note 8:
The INTVCC Abs Max peak output current is specified as the sum Lockout Hysteresis, PGOOD Delay, and EXTVCC Switchover Threshold are of current drawn by circuits internal to the module biased off of INTVCC tested at wafer sort. and current drawn by external circuits biased off of INTVCC. See the Applications Information section. Rev. A For more information www.analog.com 5 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Electrical Characteristics Typical Performance Characteristics Pin Functions Simplified Block Diagram Test Circuit Decoupling Requirements Operation Applications Information Typical Applications Package Photograph Package Description Typical Application Related Parts
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