AD8304HP 3577AHP 89410ANETWORKANALYZERCHANNEL CHANNELOUTPUT INPUT INPUTA INPUTBSOURCETRIGGER12AD8304POWERSPLITTERAD83041VNEGACOM 141VNEGACOM 142PWDNBFNG 132PWDNBFNG3VSUMVPS1 12+IN13+VR1AD8138BS3VSUMVPS1 124INPTVOUT 11ALKALINEEVALUATIONR1D CELL4INPTVOUT0.1F5VSUMVPS2 10BOARDA117505VSUMVPS2 106VPDBBFIN97501nFALKALINE D CELL6VPDBBFIN97VREFVLOG81nF7VREFVLOG8 Figure 20. Configuration for Logarithmic Figure 21. Configuration for Noise Spectral Amplifier Bandwidth Measurement Density Measurement The setup shown in Figure 20 was used for frequency response Evaluation Board measurements of the logarithmic amplifier section. In this con- An evaluation board is available for the AD8304, the schematic figuration, the AD8138 output was offset to 1.5 V and R1 was for which is shown in Figure 22, and the two board sides are adjusted to provide the appropriate operating current. The shown in Figure 23 and Figure 24. It can be configured for a wide buffer amplifier was then used; still any capacitance added at variety of experiments. The board is factory set for Photocon- the VLOG Pin during measurement would form a filter with the ductive Mode with a buffer gain of unity, providing a slope of on-chip 5 kΩ resistor. 10 mV/dB and an intercept of 100 pA. By substituting resistor and The configuration illustrated in Figure 21 measures the device capacitor values, all of the application circuits presented in this noise. Batteries provide both the supply and the input signal to data sheet can be evaluated. Table V describes the various configu- remove the supplies as a possible noise source and to reduce ration options. ground loop effects. The AD8304 Evaluation Board and the current setting resistors are mounted in closed aluminum enclo- sures to provide additional shielding to external noise sources. +VSGND–VSAD8304R1010k1VNEGACOM 14C1C2R10.1nF1nFOPEN2PWDNBFNG 13SW1R7R5R2OPENOPEN03VSUMVPS1 12C3C4BUFFERLK2 OPEN1nF0.1FR13R7OUT4INPUTINPTVOUT 110R15OPENLK1750C8INSTALLEDC115VSUMVPS2 10C7R12OPEN1nFR9R6R11OPENOPEN0.1FOPEN06VPDBBFIN9C10LOGR14BIASER0.1FOUT07VREFVLOG8C9C6C510nFOPENOPENR4OPENR3OPEN Figure 22. Evaluation Board Schematic –18– REV. A Document Outline FEATURES APPLICATIONS PRODUCT DESCRIPTION FUNCTIONAL BLOCK DIAGRAM SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS PIN CONFIGURATION PIN FUNCTION DESCRIPTIONS ORDERING GUIDE Typical Performance Characteristics BASIC CONCEPTS Optical Measurements Decibel Scaling GENERAL STRUCTURE Bandwidth and Noise Considerations Chip Enable USING THE AD8304 Slope and Intercept Adjustments Low Supply Slope and Intercept Adjustment Using the Adaptive Bias Changing the Voltage at the Summing Node Implementing Low-Pass Filters Operation in Comparator Modes Using a Negative Supply APPLICATIONS Summing Node at Ground and Voltage Inputs Providing Negative Outputs and Rescaling Inverting the Slope Programmable Level Comparator with Hysteresis Programmable Multidecade Current Source Characterization Setups and Methods Evaluation Board OUTLINE DIMENSIONS Revision History