Datasheet ZSSC3240 (Renesas) - 42
| Manufacturer | Renesas |
| Description | Sensor Signal Conditioner IC for Resistive Sensors |
| Pages / Page | 64 / 42 — ZSSC3240. Command Code. Available in. Return. Description. (Byte). Sleep … |
| Revision | 20200414 |
| File Format / Size | PDF / 1.2 Mb |
| Document Language | English |
ZSSC3240. Command Code. Available in. Return. Description. (Byte). Sleep Mode Command Mode Cyclic Mode. RESET_DIAG. Update_DIAG
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ZSSC3240 Command Code Available in Available in Available in Return Description (Byte) Sleep Mode Command Mode Cyclic Mode RESET_DIAG
– Resets the contents of B1HEX – Yes Yes No diagnosticreg to 00HEX
Update_DIAG
– Causes a complete diagnostics check cycle including memory CRC calculation, etc., and results in a reset and update of diagnosticreg B2HEX – Note: If a measurement cycle is running concur- Yes Yes No rently, the diagnostic update happens after completion of the measurement cycle and SSC calculations (and might delay the next cyclic measurement cycle)
DAC Diagnostic
– Set the DAC output register with the data in the command and enable/output B3HEX followed by the respective analog signal through AOUT data (0000HEX to – (according to the AOUT_setup) No Yes No FFFFHEX) Note: The DAC output can be switched off by the RESQ pin, POR, or a change in the main operating mode
Self-Diagnostic Measure
– The ADC performs a raw measurement with the setup from the SM_config registers, and the PGA input is disconnected from the external sensor and internally shorted (INN = INP = AGND). The ZSSC3240-internal setup, which is configured according to the ioffsc bit field in the SM_config2 register, is changed to XXHEX (transmitted with B4 the command). The respective pseudo-offset HEX followed by 24-bit raw data No Yes No 00XX signal becomes the input test signal to the PGA- HEX ADC-path. The original ioffsc and SM_config2 contents are restored after the self-diagnostic measurement completion. Note: alternatively, also a changed setup (PGA, ADC) could be used by applying Overwrite commands prior to the self-diagnostic measurement.
Set Post-Calibration Offset
– Set recent SSC- D1HEX followed by output to expected value XXXX – HEX in command Yes Yes No XXXXHEX by means of offset adjustment with coefficient SENS_shift
Startup OWI
– Initialization command to enter D2HEX – OWI interface operation; only valid for OWI (see Yes Yes Yes section 6.4.3)
Overwrite SM_config 1 shadow register
– D6HEX followed by Content (originally from NVM register 14 data (0000 HEX) in HEX to – No Yes No the digital shadow register for SM_config1 is FFFFHEX) directly overwritten with the command data [c]
Overwrite SM_config 2 shadow register
– D7HEX followed by Content (originally from NVM register 15 data (0000 HEX) in HEX to – No Yes No the digital shadow register for SM_config2 is FFFFHEX) directly overwritten with the command data [c]
Overwrite T_config 1 shadow register
– D8HEX followed by Content (originally from NVM register 16HEX or data (0000HEX to – 3CHEX) in the digital shadow register for the No Yes No FFFFHEX) temperature measurement is directly overwritten with the command data [c]
Overwrite T_config 2 shadow register
– D9HEX followed by Content (originally from NVM register 17HEX or data (0000HEX to – 3DHEX) in the digital shadow register for the No Yes No FFFFHEX) temperature measurement is directly overwritten with the command data [c] Apr.15.20 Page 42 Document Outline 1. Pin Assignments 2. Pin Descriptions 3. Absolute Maximum Ratings 4. Recommended Operating Conditions 5. Electrical Characteristics 6. Device Description 6.1 Signal Flow 6.2 Analog (Sensor) Front-End 6.2.1. Programmable-Gain Amplifier (PGA) 6.2.2. Analog-to-Digital Converter (ADC) 6.2.3. Internal Temperature Sensor 6.2.4. Supported Supplies for Sensor Elements and Additional, External Temperature Sensing 6.3 On-Chip Diagnostics 6.4 Digital Interfaces 6.4.1. SPI 6.4.2. I2C 6.4.3. One-Wire-Interface, OWI 6.5 Measurement and Output Options 6.5.1. Single Measurements, Digital Raw Results, and SSC Results 6.5.2. Cyclic, Continuous, Repeated Measurements – Measurement Scheduler 6.5.3. Analog Outputs: Digital-to-Analog Converter (DAC) 6.5.4. Output Interrupt Signaling 6.6 System Setup and Control 6.6.1. Digital Commands 6.6.2. Nonvolatile Memory (NVM) 6.6.3. Digital Sensor-Signal-Conditioning Mathematics 6.7 External, Extra LDO (LDOctrl) for Applications for > 5.5V 7. Calibration 8. Package Outline Drawings 9. Marking Diagram 10. Ordering Information 11. Glossary 12. Revision History
ZSSC3240 Command Code Available in Available in Available in Return Description (Byte) Sleep Mode Command Mode Cyclic Mode RESET_DIAG
– Resets the contents of B1HEX – Yes Yes No diagnosticreg to 00HEX
Update_DIAG
– Causes a complete diagnostics check cycle including memory CRC calculation, etc., and results in a reset and update of diagnosticreg B2HEX – Note: If a measurement cycle is running concur- Yes Yes No rently, the diagnostic update happens after completion of the measurement cycle and SSC calculations (and might delay the next cyclic measurement cycle)
DAC Diagnostic
– Set the DAC output register with the data in the command and enable/output B3HEX followed by the respective analog signal through AOUT data (0000HEX to – (according to the AOUT_setup) No Yes No FFFFHEX) Note: The DAC output can be switched off by the RESQ pin, POR, or a change in the main operating mode
Self-Diagnostic Measure
– The ADC performs a raw measurement with the setup from the SM_config registers, and the PGA input is disconnected from the external sensor and internally shorted (INN = INP = AGND). The ZSSC3240-internal setup, which is configured according to the ioffsc bit field in the SM_config2 register, is changed to XXHEX (transmitted with B4 the command). The respective pseudo-offset HEX followed by 24-bit raw data No Yes No 00XX signal becomes the input test signal to the PGA- HEX ADC-path. The original ioffsc and SM_config2 contents are restored after the self-diagnostic measurement completion. Note: alternatively, also a changed setup (PGA, ADC) could be used by applying Overwrite commands prior to the self-diagnostic measurement.
Set Post-Calibration Offset
– Set recent SSC- D1HEX followed by output to expected value XXXX – HEX in command Yes Yes No XXXXHEX by means of offset adjustment with coefficient SENS_shift
Startup OWI
– Initialization command to enter D2HEX – OWI interface operation; only valid for OWI (see Yes Yes Yes section 6.4.3)
Overwrite SM_config 1 shadow register
– D6HEX followed by Content (originally from NVM register 14 data (0000 HEX) in HEX to – No Yes No the digital shadow register for SM_config1 is FFFFHEX) directly overwritten with the command data [c]
Overwrite SM_config 2 shadow register
– D7HEX followed by Content (originally from NVM register 15 data (0000 HEX) in HEX to – No Yes No the digital shadow register for SM_config2 is FFFFHEX) directly overwritten with the command data [c]
Overwrite T_config 1 shadow register
– D8HEX followed by Content (originally from NVM register 16HEX or data (0000HEX to – 3CHEX) in the digital shadow register for the No Yes No FFFFHEX) temperature measurement is directly overwritten with the command data [c]
Overwrite T_config 2 shadow register
– D9HEX followed by Content (originally from NVM register 17HEX or data (0000HEX to – 3DHEX) in the digital shadow register for the No Yes No FFFFHEX) temperature measurement is directly overwritten with the command data [c] Apr.15.20 Page 42 Document Outline 1. Pin Assignments 2. Pin Descriptions 3. Absolute Maximum Ratings 4. Recommended Operating Conditions 5. Electrical Characteristics 6. Device Description 6.1 Signal Flow 6.2 Analog (Sensor) Front-End 6.2.1. Programmable-Gain Amplifier (PGA) 6.2.2. Analog-to-Digital Converter (ADC) 6.2.3. Internal Temperature Sensor 6.2.4. Supported Supplies for Sensor Elements and Additional, External Temperature Sensing 6.3 On-Chip Diagnostics 6.4 Digital Interfaces 6.4.1. SPI 6.4.2. I2C 6.4.3. One-Wire-Interface, OWI 6.5 Measurement and Output Options 6.5.1. Single Measurements, Digital Raw Results, and SSC Results 6.5.2. Cyclic, Continuous, Repeated Measurements – Measurement Scheduler 6.5.3. Analog Outputs: Digital-to-Analog Converter (DAC) 6.5.4. Output Interrupt Signaling 6.6 System Setup and Control 6.6.1. Digital Commands 6.6.2. Nonvolatile Memory (NVM) 6.6.3. Digital Sensor-Signal-Conditioning Mathematics 6.7 External, Extra LDO (LDOctrl) for Applications for > 5.5V 7. Calibration 8. Package Outline Drawings 9. Marking Diagram 10. Ordering Information 11. Glossary 12. Revision History
