Datasheet RH1086M (Analog Devices) - 4
| Manufacturer | Analog Devices |
| Description | 0.5A and 1.5A Low Dropout Positive Adjustable Regulators |
| Pages / Page | 6 / 4 — TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. … |
| Revision | D |
| File Format / Size | PDF / 150 Kb |
| Document Language | English |
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. TOTAL DOSE BIAS CIRCUIT
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RH1086M
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, Group C and D End Point Electrical Parameters 1 after burn-in divided by the total number of devices submitted for burn-in (Method 5005) in that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
15V VIN RH1086M VOUT ADJ 150Ω –15V RH1086 TA01 Rev. D 4 For more information www.analog.com Document Outline Description Burn-In Circuit Package Information Absolute Maximum Ratings Preconditioning Table 1: Electrical Characteristics Table 1a: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics Revision History
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, Group C and D End Point Electrical Parameters 1 after burn-in divided by the total number of devices submitted for burn-in (Method 5005) in that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
15V VIN RH1086M VOUT ADJ 150Ω –15V RH1086 TA01 Rev. D 4 For more information www.analog.com Document Outline Description Burn-In Circuit Package Information Absolute Maximum Ratings Preconditioning Table 1: Electrical Characteristics Table 1a: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics Revision History
