TOP FET gate measurement (VG - VSW) using one probe
| Authors | Kurk Mathews, Luis Onofre Lazaro |
| Main Document | Article «Low voltage GaN converter gate drive and measurement» |
| Description | Figure 6 |
| File Format / Size | PDF / 24 Kb |
| Document Language | English |
Other Materials from the Main Document
- Article «Low voltage GaN converter gate drive and measurement»
- Figure 1. The LTC7891 step-down (buck) converter schematic
- Figure 2. GaN controller with internal smart bootstrap switch
- Figure 3. Turn-on waveforms with isolated probe
- Figure 5. TOP FET gate measurement (VG - VSW) using A - B method
- Figure 6. TOP FET gate measurement (VG - VSW) using one probe