First implementation of the practical circuit used to measure I_DSS and V_P

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Other Materials from the Main Document

• Article «A simple circuit to let you characterize JFETs more accurately»
• Figure 1. A standard N-JFET drain-source current vs gate-source voltage curve
• Figure 2. A basic, improved circuit for the JFET I_DSS and V_P measurement
• Figure 3. First implementation of the practical circuit used to measure I_DSS and V_P
• Figure 4. A circuit with the tailored measurement range that is suited for most JFETs
• Figure 5. The readout circuit with sensitive polarity indication